Corrections of the NIST Statistical Test Suite for Randomness

Song-Ju Kim; Ken Umeno; Akio Hasegawa

Paper 2004/018

Corrections of the NIST Statistical Test Suite for Randomness

Song-Ju Kim, Ken Umeno, and Akio Hasegawa

Abstract

It is well known that the NIST statistical test suite was used for the evaluation of AES candidate algorithms. We have found that the test setting of Discrete Fourier Transform test and Lempel-Ziv test of this test suite are wrong. We give four corrections of mistakes in the test settings. This suggests that re-evaluation of the test results should be needed.

Metadata

Available format(s): PDF PS
Publication info: Published elsewhere. Unknown where it was published
Keywords: pseudo-randomness AES
Contact author(s): songju @ crl go jp
History: 2004-01-27: received
Short URL: https://ia.cr/2004/018
License: CC BY

BibTeX

@misc{cryptoeprint:2004/018,
      author = {Song-Ju Kim and Ken Umeno and Akio Hasegawa},
      title = {Corrections of the {NIST} Statistical Test Suite for Randomness},
      howpublished = {Cryptology {ePrint} Archive, Paper 2004/018},
      year = {2004},
      url = {https://eprint.iacr.org/2004/018}
}