Paper 2004/018

Corrections of the NIST Statistical Test Suite for Randomness

Song-Ju Kim, Ken Umeno, and Akio Hasegawa

Abstract

It is well known that the NIST statistical test suite was used for the evaluation of AES candidate algorithms. We have found that the test setting of Discrete Fourier Transform test and Lempel-Ziv test of this test suite are wrong. We give four corrections of mistakes in the test settings. This suggests that re-evaluation of the test results should be needed.

Metadata
Available format(s)
PDF PS
Publication info
Published elsewhere. Unknown where it was published
Keywords
pseudo-randomnessAES
Contact author(s)
songju @ crl go jp
History
2004-01-27: received
Short URL
https://ia.cr/2004/018
License
Creative Commons Attribution
CC BY

BibTeX

@misc{cryptoeprint:2004/018,
      author = {Song-Ju Kim and Ken Umeno and Akio Hasegawa},
      title = {Corrections of the {NIST} Statistical Test Suite for Randomness},
      howpublished = {Cryptology {ePrint} Archive, Paper 2004/018},
      year = {2004},
      url = {https://eprint.iacr.org/2004/018}
}
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