Paper 2003/010
Differential Fault Analysis on A.E.S.
Abstract
This paper investigates Differential Fault Analysis (DFA) on the Advanced Encryption Standard (AES). Following the Bellcore fault model [2], we assume the injection of a single-byte error during the final rounds of encryption. We show how such faults propagate through AES transformations and demonstrate that the last round key can be derived with only a small number of faulty ciphertexts. From this information, the original cipher key can be efficiently reconstructed. Numerical simulations confirm the practicality of the attack, requiring fewer than ten faulty outputs to recover a complete subkey. Our results highlight the vulnerability of AES implementations in tamper-resistant devices, such as smart cards, when exposed to fault injections. These findings emphasize the importance of incorporating robust error-detection and fault-resilient countermeasures in secure hardware.
Note: Summary of modifications of this version • The abstract of the article has been enriched and refined for greater clarity, and typographical errors in the text have been corrected. • The attribution of authorship has been clarified and explicitly stated in the abstract in order to make their contributions transparent and consistent with good academic practice.
Metadata
- Available format(s)
-
PDF
- Category
- Secret-key cryptography
- Publication info
- Published elsewhere. Minor revision. Applied Cryptography and Network Security
- DOI
- 10.1007/978-3-540-45203-4_23
- Keywords
- SmartcardsAESDFASymmetric cryptographySide-channel attacksHardware securitySubkey recoveryFault injection
- Contact author(s)
- olivier @ vivolo dev
- History
- 2025-08-19: last of 3 revisions
- 2003-01-20: received
- See all versions
- Short URL
- https://ia.cr/2003/010
- License
-
CC BY
BibTeX
@misc{cryptoeprint:2003/010,
author = {O. Vivolo and P. Dusart and G. Letourneux},
title = {Differential Fault Analysis on A.E.S.},
howpublished = {Cryptology {ePrint} Archive, Paper 2003/010},
year = {2003},
doi = {10.1007/978-3-540-45203-4_23},
url = {https://eprint.iacr.org/2003/010}
}