Paper 2025/854

ProbeNav - Fast, precise and repeatable positioning of electromagnetic probes for local Side-Channel Attacks

Abstract

Localized side-channel analysis makes it possible to evaluate only the relevant chip area by measuring near-field electromagnetic (EM) emanations. Compared to global power measurements, this can lead to more powerful attacks as the signal-to-noise ratio is higher and irrelevant circuit components are not included in the recorded measurements. Especially for profiled attacks and their reproduction, the probe position in a localized scenario is of utmost importance. Ideally a probe should be placed identically during the profiling and attack phases, as small variations can have a large impact on the success of the attack. In this work we present our methodology – ProbeNav – to accurately reposition an EM probe which is optimized for localized measurements, i.e., near-field measurements. We evaluate cross-correlation, Oriented Fast and rotated Brief (ORB) and particle filters to re-calibrate the coordinate system of our setup. As a result, our methodologies show that precise positioning on a STM32F303 microcontroller is possible for a profiled attack scenario with different EM probes. Furthermore, by requiring only a single trace per position, profiling is 3 times and repositioning 28 faster in terms of number of collected traces compared to the state of the art.