Paper 2025/2165

Extending and Accelerating Inner Product Masking with Fault Detection via Instruction Set Extension

Songqiao Cui, KU Leuven
Geng Luo, National University of Singapore
Junhan Bao, Independent Researcher
Josep Balasch, Rambus
Ingrid Verbauwhede, KU Leuven
Abstract

Inner product masking is a well-studied masking countermeasure against side-channel attacks. IPM-FD further extends the IPM scheme with fault detection capabilities. However, implementing IPM-FD in software especially on embedded devices results in high computational overhead. Therefore, in this work we perform a detailed analysis of all building blocks for IPM-FD scheme and propose a Masked Processing Unit to accelerate all operations, for example multiplication and IPM-FD specific Homogenization. We can then offload these computational extensive operations with dedicated hardware support. With only $4.05\%$ and $4.01\%$ increase in Look-Up Tables and Flip-Flops (Random Number Generator excluded), respectively, compared with baseline CV32E40p RISC-V core, we can achieve up to $16.55\times$ speed-up factor with optimal configuration. We then practically evaluate the side-channel security via uni- and bivariate Test Vector Leakage Assessment which exhibits no leakage. Finally, we use two different methods to simulate the injected fault and confirm the fault detection capability of up to $k-1$ faults, with $k$ being the replication factor.

Note: This is the version submitted to DATE 2026, which has been accepted without modification.

Metadata
Available format(s)
PDF
Category
Implementation
Publication info
Published elsewhere. Minor revision. DATE 2026
Keywords
Hardware securityside-channel attackfault-injection attackRISC-VISE
Contact author(s)
songqiao cui @ esat kuleuven be
luo geng @ comp nus edu sg
postbjh @ 126 com
jbalasch @ rambus com
ingrid verbauwhede @ esat kuleuven be
History
2025-12-01: approved
2025-11-28: received
See all versions
Short URL
https://ia.cr/2025/2165
License
Creative Commons Attribution
CC BY

BibTeX

@misc{cryptoeprint:2025/2165,
      author = {Songqiao Cui and Geng Luo and Junhan Bao and Josep Balasch and Ingrid Verbauwhede},
      title = {Extending and Accelerating Inner Product Masking  with Fault Detection via Instruction Set Extension},
      howpublished = {Cryptology {ePrint} Archive, Paper 2025/2165},
      year = {2025},
      url = {https://eprint.iacr.org/2025/2165}
}
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