Paper 2025/2102
A Graph-Theoretic Framework for Randomness Optimization in First-Order Masked Circuits
Abstract
We present a generic, automatable framework to reduce the demand for fresh randomness in first-order masked circuits while preserving security in the glitch-extended probing model. The method analyzes the flow of randomness through a circuit to establish security rules based on the glitch-extended probing model. These rules are then encoded as an interference graph, transforming the optimization challenge into a graph coloring problem, which is solved efficiently with a DSATUR heuristic. Crucially, the optimization only rewires randomness inputs without altering core logic, ensuring seamless integration into standard EDA flows and applicability to various gadgets like DOM-indep (Domain-Oriented Masking) and HPC (Hardware Private Circuits). On 32-bit adder architectures, the framework substantially reduces randomness requirements by 79–90%; for instance, the Kogge–Stone adder's requirement of 259 unique random inputs is reduced to 27. All optimized designs were evaluated using PROLEAD, with the leakage results indicating compliance with first-order glitch-extended probing security.
Metadata
- Available format(s)
-
PDF
- Category
- Implementation
- Publication info
- Published elsewhere. Minor revision. DATE 2026
- DOI
- 10.23919/DATE69613.2026.11539466
- Keywords
- Side-Channel AnalysisMaskingProbing SecuritySecurity-Aware OptimizationHardwareRandomness
- Contact author(s)
-
dilipv46 @ gmail com
benedikt gierlichs @ esat kuleuven be
ingrid verbauwhede @ esat kuleuven be - History
- 2026-06-19: last of 3 revisions
- 2025-11-15: received
- See all versions
- Short URL
- https://ia.cr/2025/2102
- License
-
CC BY
BibTeX
@misc{cryptoeprint:2025/2102,
author = {Dilip Kumar S. V. and Benedikt Gierlichs and Ingrid Verbauwhede},
title = {A Graph-Theoretic Framework for Randomness Optimization in First-Order Masked Circuits},
howpublished = {Cryptology {ePrint} Archive, Paper 2025/2102},
year = {2025},
doi = {10.23919/DATE69613.2026.11539466},
url = {https://eprint.iacr.org/2025/2102}
}