Paper 2024/1356

Leakage-Resilience of Circuit Garbling

Ruiyang Li, Shandong University
Yiteng Sun, Shandong University
Chun Guo, Shandong University
Francois-Xavier Standaert, ICTEAM/ELEN/Crypto Group, UCL, Louvain-la-Neuve, Belgium
Weijia Wang, Shandong University
Xiao Wang, Northwestern University, Evanston, USA
Abstract

Due to the ubiquitous requirements and performance leap in the past decade, it has become feasible to execute garbling and secure computations in settings sensitive to side-channel attacks, including smartphones, IoTs and dedicated hardwares, and the possibilities have been demonstrated by recent works. To maintain security in the presence of a moderate amount of leaked information about internal secrets, we investigate {\it leakage-resilient garbling}. We augment the classical privacy, obliviousness and authenticity notions with leakages of the garbling function, and define their leakage-resilience analogues. We examine popular garbling schemes and unveil additional side-channel weaknesses due to wire label reuse and XOR leakages. We then incorporate the idea of label refreshing into the GLNP garbling scheme of Gueron et al. and propose a variant GLNPLR that provably satisfies our leakage-resilience definitions. Performance comparison indicates that GLNPLR is 60X (using AES-NI) or 5X (without AES-NI) faster than the HalfGates garbling with second order side-channel masking, for garbling AES circuit when the bandwidth is 2Gbps.

Metadata
Available format(s)
PDF
Category
Secret-key cryptography
Publication info
Published elsewhere. Major revision. ACM CCS 2024
DOI
10.1145/3658644.3690204
Keywords
leakage-resiliencegarbling
Contact author(s)
ruiyang li @ mail sdu edu cn
sunyiteng @ mail sdu edu cn
chun guo @ sdu edu cn
fstandae @ uclouvain be
wjwang @ sdu edu cn
wangxiao @ northwestern edu
History
2024-08-30: approved
2024-08-29: received
See all versions
Short URL
https://ia.cr/2024/1356
License
No rights reserved
CC0

BibTeX

@misc{cryptoeprint:2024/1356,
      author = {Ruiyang Li and Yiteng Sun and Chun Guo and Francois-Xavier Standaert and Weijia Wang and Xiao Wang},
      title = {Leakage-Resilience of Circuit Garbling},
      howpublished = {Cryptology {ePrint} Archive, Paper 2024/1356},
      year = {2024},
      doi = {10.1145/3658644.3690204},
      url = {https://eprint.iacr.org/2024/1356}
}
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