Cryptology ePrint Archive: Report 2022/172
A remark on NIST SP 800-22 serial test
Corina-Elena Bogos and Razvan Mocanu and Emil Simion
Abstract: This paper represents a cumulative review of the serial statistical test over the canonical values used in testing and freely generated values. Also in this paper, we study by simulation, the variation of second type error, depending on certain factors: the range of p1,the length of the bit string represented by n and the value of m-bit pattern.
Category / Keywords: implementation / pseudo-random generators, serial test, second type error
Date: received 14 Feb 2022
Contact author: corina iftinca v at gmail com, esimion at fmi unibuc ro, mocanurazvan123 at gmail com
Available format(s): PDF | BibTeX Citation
Version: 20220220:201049 (All versions of this report)
Short URL: ia.cr/2022/172
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