Cryptology ePrint Archive: Report 2022/172

A remark on NIST SP 800-22 serial test

Corina-Elena Bogos and Razvan Mocanu and Emil Simion

Abstract: This paper represents a cumulative review of the serial statistical test over the canonical values used in testing and freely generated values. Also in this paper, we study by simulation, the variation of second type error, depending on certain factors: the range of p1,the length of the bit string represented by n and the value of m-bit pattern.

Category / Keywords: implementation / pseudo-random generators, serial test, second type error

Date: received 14 Feb 2022

Contact author: corina iftinca v at gmail com, esimion at fmi unibuc ro, mocanurazvan123 at gmail com

Available format(s): PDF | BibTeX Citation

Version: 20220220:201049 (All versions of this report)

Short URL: ia.cr/2022/172