Efficiently Testable Circuits

Mirza Ahad Baig; Suvradip Chakraborty; Stefan Dziembowski; Małgorzata Gałązka; Tomasz Lizurej; Krzysztof Pietrzak

Paper 2022/1598

Efficiently Testable Circuits

Mirza Ahad Baig, ISTA

Suvradip Chakraborty, ETH Zurich

Stefan Dziembowski, University of Warsaw and IDEAS NCBR

Małgorzata Gałązka, University of Warsaw

Tomasz Lizurej, University of Warsaw and IDEAS NCBR

Krzysztof Pietrzak, ISTA

Abstract

In this work, we put forward the notion of ``efficiently testable circuits'' and provide circuit compilers that transform any circuit into an efficiently testable one. Informally, a circuit is testable if one can detect tampering with the circuit by evaluating it on a small number of inputs from some test set. Our technical contribution is a compiler that transforms any circuit into a testable circuit for which we can detect arbitrary tampering with all wires in . The notion of a testable circuit is weaker or incomparable to existing notions of tamper-resilience, which aim to detect or even correct for errors introduced by tampering during every query, but our new notion is interesting in several settings, and we achieve security against much more general tampering classes -- like tampering with all wires -- with very modest overhead. Concretely, starting from a circuit of size and depth , for any (think of as a small constant, say ), we get a testable where is of size and depth . The test set is of size . The number of extra input and output wires (i.e., pins) we need to add for the testing is and , respectively.

Note: This is a full version of a paper "Efficiently Testable Circuits" which got accepted to ITCS 2023.

Metadata

Available format(s): PDF
Category: Foundations
Publication info: Published elsewhere. ITCS 2023
Keywords: circuit compilers circuit integrity circuit testing
Contact author(s): mirzabaig cmi @ gmail com
suvradip1111 @ gmail com
stefan dziembowski @ crypto edu pl
malgorzata bladoszewska @ gmail com
tomasz lizurej @ crypto edu pl
pietrzak @ ist ac at
History: 2022-11-21: approved; 2022-11-16: received; See all versions
Short URL: https://ia.cr/2022/1598
License: CC BY

BibTeX

@misc{cryptoeprint:2022/1598,
      author = {Mirza Ahad Baig and Suvradip Chakraborty and Stefan Dziembowski and Małgorzata Gałązka and Tomasz Lizurej and Krzysztof Pietrzak},
      title = {Efficiently Testable Circuits},
      howpublished = {Cryptology {ePrint} Archive, Paper 2022/1598},
      year = {2022},
      url = {https://eprint.iacr.org/2022/1598}
}