Cryptology ePrint Archive: Report 2018/1181

Horizontal DEMA Attack as the Criterion to Select the Best Suitable EM Probe

Christian Wittke and Ievgen Kabin and Dan Klann and Zoya Dyka and Anton Datsuk and Peter Langendoerfer

Abstract: Implementing cryptographic algorithms in a tamper resistant way is an extremely complex task as the algorithm used and the target platform have a significant impact on the potential leakage of the implementation. In addition the quality of the tools used for the attacks is of importance. In order to evaluate the resistance of a certain design against electromagnetic emanation attacks as a highly relevant type of attacks we discuss the quality of different electromagnetic (EM) probes as attack tools. In this paper we propose to use the results of horizontal attacks for comparison of measurement setup and for determining the best suitable instruments for measurements. We performed horizontal differential electromagnetic analysis (DEMA) attacks against our ECC design that is an im-plementation of the Montgomery kP algorithm for the NIST elliptic curve B-233. We experimented with 7 different EM probes under same conditions: attacked FPGA, design, inputs, measurement point and measurement equipment were the same, excepting EM probes. The used EM probe influences the success rate of performed attack significantly. We used this fact for the comparison of probes and for determining the best suitable one.

Category / Keywords: Side channel analysis, horizontal differential electromagnetic analysis attack (DEMA), electromagnetic (EM) probe, difference of the mean test

Date: received 3 Dec 2018, last revised 21 Dec 2018

Contact author: wittke at ihp-microelectronics com

Available format(s): PDF | BibTeX Citation

Version: 20181221:123046 (All versions of this report)

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