Cryptology ePrint Archive: Report 2016/863

Available versions in chronological order


More Powerful and Reliable Second-level Statistical Randomness Tests for NIST SP 800-22
Shuangyi Zhu and Yuan Ma and Jingqiang Lin and Jia Zhuang and Jiwu Jing
Original publication (in the same form): IACR-ASIACRYPT-2016


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