Paper 2014/870

Dynamic Behavior of RS latches using FIB processing and probe connection

Naoya Torii and Dai Yamamoto and Masahiko Takenaka and Tsutomu Matsumoto

Abstract

PUF (Physically Unclonable Function) technologies attract attention as a candidate to prevent counterfeit chips. A latch PUF is known as a high performance PUF among various types of proposed PUFs. In this paper we describe an experiment on a dynamic attack to a latch PUF consisting of RS latches, such as measuring the latch output by a probe connection after a FIB (Focused Ion Beam) processing. As a result, we confirmed that the latch PUF using the RS latch has a tolerance for the dynamic analysis, because the RS latch output was influenced and changed by the FIB processing in our experiment.

Note: Two data in the number of latches in Table 4 is correctly revision.