Cryptology ePrint Archive: Report 2013/603

Invariance-Based Concurrent Error Detection for Advanced Encryption Standard

Xiaofei Guo and Ramesh Karri

Abstract: Naturally occurring and maliciously injected faults reduce the reliability of Advanced Encryption Standard (AES) and may leak confidential information. We developed an invariance-based concurrent error detection (CED) scheme which is independent of the implementation of AES encryption/decryption. Additionally, we improve the security of our scheme with Randomized CED Round Insertion and adaptive checking. Experimental results show that the invariance-based CED scheme detects all single-bit, all single-byte fault, and 99.99999997% of burst faults. The area and delay overheads of this scheme are compared with those of previously reported CED schemes on two Xilinx Virtex FPGAs. The hardware overhead is in the 13.2-27.3% range and the throughput is between 1.8-42.2Gbps depending on the AES architecture, FPGA family, and the detection latency. One can im- plement our scheme in many ways; designers can trade off performance, reliability, and security according to the available resources.

Category / Keywords: implementation / Concurrent error detection, Differential fault analysis, Fault attack

Original Publication (in the same form): ACM/IEEE Design Automation Conference, pp. 573-578, Jun. 2012

Date: received 21 Sep 2013, last revised 23 Sep 2013

Contact author: xg243 at nyu edu

Available format(s): PDF | BibTeX Citation

Version: 20130923:233258 (All versions of this report)

Short URL:

[ Cryptology ePrint archive ]