On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in CMOS technology

Theresa Krüger

Paper 2024/396

On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in CMOS technology

Theresa Krüger

Abstract

The possible effects of irradiation on security controllers implemented in CMOS technology are studied. First, the decrease of the effectiveness of a light sensor/detector as countermeasure against laser fault injection is analysed. Second, the use of irradiation as fault injection method is proposed.

Metadata

Available format(s): PDF
Category: Implementation
Publication info: Preprint.
Keywords: irradition sensor damage fault injection attack potential
Contact author(s): theresa krueger @ telekom de
History: 2024-03-05: approved; 2024-03-04: received; See all versions
Short URL: https://ia.cr/2024/396
License: CC BY

BibTeX

@misc{cryptoeprint:2024/396,
      author = {Theresa Krüger},
      title = {On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in CMOS technology},
      howpublished = {Cryptology ePrint Archive, Paper 2024/396},
      year = {2024},
      note = {\url{https://eprint.iacr.org/2024/396}},
      url = {https://eprint.iacr.org/2024/396}
}