Cryptology ePrint Archive: Report 2014/544

Secure Mutual Testing Strategy for Cryptographic SoCs

Amitabh Das, Dusko Karaklajic and Ingrid Verbauwhede

Abstract: This article presents a secure mutual testing strategy for System-on-Chips (SoCs) that implement cryptographic functionalities. Such approach eliminates the need for an additional trusted component that is used to test security sensitive cores in a SoC, like symmetric and public-key cryptographic modules. We combine two test approaches: Logic Built In Self Test (BIST) and secure scan-chain based testing and develop a strategy that preserves the test quality of the standard test methods, enhancing security of the testing scheme. In order to minimize the area overhead of the presented solution, we re-use the existing modules in different manners: a public-key cryptographic core to build the BIST infrastructure and a symmetric one to authenticate a device under test to a test server, thus preventing an unauthorized user from accessing the test interface. By doing so, we achieve both testability and security at the minimal cost.

Category / Keywords: implementation / Secure Testing, BIST, Scan-chains, Test Wrapper, Cryptographic SoC

Date: received 14 Jul 2014

Contact author: amitabh das at esat kuleuven be

Available format(s): PDF | BibTeX Citation

Version: 20140718:070849 (All versions of this report)

Short URL: ia.cr/2014/544

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