Paper 2014/544
Secure Mutual Testing Strategy for Cryptographic SoCs
Amitabh Das, Dusko Karaklajic, and Ingrid Verbauwhede
Abstract
This article presents a secure mutual testing strategy for System-on-Chips (SoCs) that implement cryptographic functionalities. Such approach eliminates the need for an additional trusted component that is used to test security sensitive cores in a SoC, like symmetric and public-key cryptographic modules. We combine two test approaches: Logic Built In Self Test (BIST) and secure scan-chain based testing and develop a strategy that preserves the test quality of the standard test methods, enhancing security of the testing scheme. In order to minimize the area overhead of the presented solution, we re-use the existing modules in different manners: a public-key cryptographic core to build the BIST infrastructure and a symmetric one to authenticate a device under test to a test server, thus preventing an unauthorized user from accessing the test interface. By doing so, we achieve both testability and security at the minimal cost.
Metadata
- Available format(s)
-
PDF
- Category
- Implementation
- Publication info
- Preprint. MINOR revision.
- Keywords
- Secure TestingBISTScan-chainsTest WrapperCryptographic SoC
- Contact author(s)
- amitabh das @ esat kuleuven be
- History
- 2014-07-18: received
- Short URL
- https://ia.cr/2014/544
- License
-
CC BY
BibTeX
@misc{cryptoeprint:2014/544,
author = {Amitabh Das and Dusko Karaklajic and Ingrid Verbauwhede},
title = {Secure Mutual Testing Strategy for Cryptographic {SoCs}},
howpublished = {Cryptology {ePrint} Archive, Paper 2014/544},
year = {2014},
url = {https://eprint.iacr.org/2014/544}
}
