A Fault Analytic Method against HB+

Jose Carrijo; Rafael Tonicelli; Anderson C.  A.  Nascimento

Paper 2010/508

A Fault Analytic Method against HB+

Jose Carrijo, Rafael Tonicelli, and Anderson C. A. Nascimento

Abstract

The search for lightweight authentication protocols suitable for low-cost RFID tags constitutes an active and challenging research area. In this context, a family of protocols based on the LPN problem has been proposed: the so-called HB-family. Despite the rich literature regarding the cryptanalysis of these protocols, there are no published results about the impact of fault analysis over them. The purpose of this paper is to fill this gap by presenting a fault analytic method against a prominent member of the HB-family: HB+ protocol. We demonstrate that the fault analysis model can lead to a flexible and effective attack against HB-like protocols, posing a serious threat over them.

Metadata

Available format(s): PDF
Category: Cryptographic protocols
Publication info: Published elsewhere. Unknown where it was published
Keywords: Fault analysis authentication protocols HB+ protocol RFID systems.
Contact author(s): rafaeltonicelli @ gmail com
History: 2010-10-05: received
Short URL: https://ia.cr/2010/508
License: CC BY

BibTeX

@misc{cryptoeprint:2010/508,
      author = {Jose Carrijo and Rafael Tonicelli and Anderson C.  A.  Nascimento},
      title = {A Fault Analytic Method against {HB}+},
      howpublished = {Cryptology {ePrint} Archive, Paper 2010/508},
      year = {2010},
      url = {https://eprint.iacr.org/2010/508}
}