Cryptology ePrint Archive: Report 2004/083
Scan Based Side Channel Attack on Data Encryption Standard
Bo Yang and Kaijie Wu and Ramesh Karri
Abstract: Scan based test is a double edged sword. On one hand, it is a powerful test technique. On the other hand, it is an equally powerful attack tool. In this paper we show that scan chains can be used as a side channel to recover secret keys from a hardware implementation of the Data Encryption Standard (DES).
By loading pairs of known plaintexts with one-bit difference in the normal mode and then scanning out the internal state in the test mode, we first determine the position of all scan elements in the scan chain. Then, based on a systematic analysis of the structure of the non-linear substitution boxes, and using three additional plaintexts we discover the DES secret key. Finally, some assumptions in the attack are discussed.
Category / Keywords: applications / DES, scan based test
Date: received 17 Mar 2004
Contact author: yangbo at photon poly edu
Available format(s): PDF | BibTeX Citation
Version: 20040328:190829 (All versions of this report)
Short URL: ia.cr/2004/083
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