Scan Based Side Channel Attack on Data Encryption Standard

Bo Yang; Kaijie Wu; Ramesh Karri

Paper 2004/083

Scan Based Side Channel Attack on Data Encryption Standard

Bo Yang, Kaijie Wu, and Ramesh Karri

Abstract

Scan based test is a double edged sword. On one hand, it is a powerful test technique. On the other hand, it is an equally powerful attack tool. In this paper we show that scan chains can be used as a side channel to recover secret keys from a hardware implementation of the Data Encryption Standard (DES). By loading pairs of known plaintexts with one-bit difference in the normal mode and then scanning out the internal state in the test mode, we first determine the position of all scan elements in the scan chain. Then, based on a systematic analysis of the structure of the non-linear substitution boxes, and using three additional plaintexts we discover the DES secret key. Finally, some assumptions in the attack are discussed.

Metadata

Available format(s): PDF
Category: Applications
Publication info: Published elsewhere. Unknown where it was published
Keywords: DES scan based test
Contact author(s): yangbo @ photon poly edu
History: 2004-03-28: received
Short URL: https://ia.cr/2004/083
License: CC BY

BibTeX

@misc{cryptoeprint:2004/083,
      author = {Bo Yang and Kaijie Wu and Ramesh Karri},
      title = {Scan Based Side Channel Attack on Data Encryption Standard},
      howpublished = {Cryptology {ePrint} Archive, Paper 2004/083},
      year = {2004},
      url = {https://eprint.iacr.org/2004/083}
}